Electron Optics - Summer 2001
session
PH 410, PH 510
M-Th 4pm-6:15pm June25-July19
Room SB2 104
Continue your E&M
studies with this course in the behavior of electrons in static electric and
magnetic fields. We start with a review of light optics, definitions of lenses,
focal length and distance and proceed to the analogous optics of charged particles.
Using purely analytical techniques, we will cover a simple single aperture
electrostatic lens and develop the first order focusing properties of multi-aperture
electrostatic lenses. Along the way, we will be assisted in understanding
electron (and ion) trajectories by a computer program (SIMION) which allows
you to visualize the trajectories of electrons (and ions) on your own PC.
After studying the first order focusing
characteristics of electrostatic electron lenses, we will proceed to lens and
image aberration theory, concentrating on spherical aberration, including the
rarely noted but significant non-planar focal surface. The non-classroom sessions
in the labs will concentrate on experimental measurement of focal distance,
length and spherical aberration for a particular electrostatic lens in an electron
optical workbench. We will also demonstrate electron optical analytical instruments
within the Physics Department labs, including a Focused Ion Beam System (FIB)
and Photoelectron Microscope (PEM). Time permitting, we will include various
numerical simulation techniques used in electron optics, the theory of resolution
and electron sources (cathodes).
Course
Schedule
Homework
I
Index
of Refraction
Magnetic and
Electrostatic Deflection
Hyperbolic Lens
Homework
II
Homework
III
DAVCAL
Homework
IV
Lablens
Physics Department page
Last modified June 30, 2000